发明名称 METHOD FOR CLEANING IC SOCKET
摘要 PROBLEM TO BE SOLVED: To realize a method for cleaning IC sockets capable of reliably cleaning the contact parts of IC sockets used for measuring and evaluating tests by a relatively simple operation. SOLUTION: An IC socket 16 with a contact part 15 to come into contact with a device to be measured is mounted to a dedicated jig 18 to short-circuit the contact part 15 electrically. Then, the contact part 15 is immersed in an electrolyte solution 12 in a cleaning chamber. An electrode 13 connected to a D.C. power source 21 is provided in the electrolyte solution 12 in the above- mentioned cleaning chamber, and a current is passed between the contact part 15 and the electrode 13 in the electrolyte solution 12 to remove solder residues adhered to the contact part 15.
申请公布号 JP2000097992(A) 申请公布日期 2000.04.07
申请号 JP19980270064 申请日期 1998.09.24
申请人 SANTESUTO KK;RINREI TAPE KK;FUJI KASEI KK 发明人 YAMAI ATSUSHI;KAJIKAWA KATSUHIKO
分类号 H01R33/76;G01R31/26;H01L23/32;(IPC1-7):G01R31/26 主分类号 H01R33/76
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