发明名称 METHOD AND DEVICE FOR HEAT TREATMENT
摘要 PROBLEM TO BE SOLVED: To provide a method and device for heat treatment wherein the temperature distribution in the space above a substrate is made constant during heat treatment. SOLUTION: Related to a heat treatment method wherein a wafer W is placed on a mount stage 33 provided in a treatment vessel 30 and the wafer W is heated at 120 deg.C by a heating element 34 buried inside the mount stage 33, and a gas 41 pre-heated to 120 deg.C by a heater 42 is straightened to parallel to the wafer W by a straightening vane 44 provided near a supply port 43, for stream in a space 37 above the wafer W.
申请公布号 JP2000100683(A) 申请公布日期 2000.04.07
申请号 JP19990200280 申请日期 1999.07.14
申请人 TOKYO ELECTRON LTD 发明人 MATSUYAMA YUJI
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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