发明名称 METHOD AND DEVICE FOR DIAGNOSING ABNORMALITY AT CONTACT POINT OF ELECTRIC/MECHANICAL APPARATUS
摘要 PROBLEM TO BE SOLVED: To promptly display the abnormal condition of internal contact piece as well as abnormal overheat on the surface of contact part on a screen, by projecting X-rays to such a contact part where presence of overheat is judged by an infrared detector for acquiring internal condition. SOLUTION: The surface temperature at each part of a contact part is measured by an infrared detector, and presence of overheat is judged based on a table containing a measured temperature and pre-determined tolerable temperature value. Based on the X-ray data acquired by projecting X-ray to such contact part as judged to be overheated, the internal condition of the contact part is acquired. For example, an X-ray generator 31 and X-ray detector 32 are provided near a tank 11, and X-ray is projected to each part which is judged to require an X-ray inspection by a computer, with the X-ray data inputted in a personal computer 33 and an image processing device 35 provided with an image display device. Based on the input value, an image process is performed and the inspected interior is displayed as an image. Thus, a warn amount of contact piece and presence of flow are acquired.
申请公布号 JP2000097778(A) 申请公布日期 2000.04.07
申请号 JP19980266014 申请日期 1998.09.21
申请人 HITACHI ENGINEERING & SERVICES CO LTD 发明人 YONEDA YOSHIYUKI;OGA EIGO
分类号 G01N23/04;G01J5/10;G01J5/48;G01N25/72;(IPC1-7):G01J5/10 主分类号 G01N23/04
代理机构 代理人
主权项
地址