发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE WITH BIPOLAR TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device with a bipolar transistor, in which the bipolar transistor with good AC characteristics and stable and high DC current amplifying rate can be obtained easily. SOLUTION: A base diffusion layer 6 and a high-density base diffused layer 7 are formed on the face of a semiconductor substrate 1, and an insulating film 8 is grown on the surface thereof. An emitter forming contact hole 9 is formed in the insulating film 8, on a base diffused layer 6. The semiconductor device is dipped in a solution, containing hydrofluoric acid, to completely remove a natural oxide film on a surface of the base diffused layer 6. The solution containing the hydrofluoric acid is displaced by pure water, so that a stable bonding of silicon-hydrogen is formed on the surface of the base diffused layer 6, and the growth of a natural oxide film is prevented since then. The semiconductor device is dipped in a solution, containing hydrogen peroxide so that a silicon oxide film 16 with a uniform thickness of less than 10Åis formed on the surface of the base diffusion layer 6.
申请公布号 JP2000100827(A) 申请公布日期 2000.04.07
申请号 JP19980271451 申请日期 1998.09.25
申请人 NEC CORP 发明人 MATSUBA SHIYOUICHI
分类号 H01L29/73;H01L21/331;H01L21/8249;H01L27/06;H01L29/732;(IPC1-7):H01L21/331;H01L21/824 主分类号 H01L29/73
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