发明名称 APPEARANCE INSPECTING METHOD FOR LINEAR MATTER, AND DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for carrying out appearance inspection for a linear matter having nonlinear matter portions in its both ends. SOLUTION: This device has a fixing jig 4 for fixing nonlinear matter portions 2, 3 in both ends, a conveying means 9 therefor, a means 5 retreating outside from a course of a linear matter 1 during conveyance and moving inside the cource of the linear matter 1 in an inspection to apply a tension, a means 6 for grasping the nonlinear matter portions 2, 3 to move them vertically, image- picking up means 7-1, 7-2 for picking up an image of an inspected object, a means 10 for moving the image-picking-up means 7-1 vertically, and image processors 8-1, 8-2 for processing the image image-picked up by the image- picking-up means 7-1, 7-2 determine the presence of a detect. The nonlinear matter portions 2, 3 in both ends are fixed at substantially same height with a prescribed space using the inspection device, and the member 5 inserted between the linear matter 1 portions is biased downward to apply the tensions to the linear matter 1 portions.
申请公布号 JP2000097875(A) 申请公布日期 2000.04.07
申请号 JP19980272154 申请日期 1998.09.25
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 KISHI YASUYUKI;NAKAMURA JUNJI;KIRIGATANI MASAHIRO
分类号 G01N21/89;G01N21/892;G01N21/95;(IPC1-7):G01N21/89 主分类号 G01N21/89
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