发明名称 PROBE ARRAY, MANUFACTURE THEREOF AND FINE MICROMACHINING DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a probe array for fine machining, enabling easy manufacture and uniform machining. SOLUTION: A probe array 1 having a plurality of probes has an elastic material at least for a part of a probe 102 and probe base 100. As a result, the probes are constituted so as to be movable along a direction approximately vertical to the machined surface of the probes, depending on the stresses applied to the fine end of the probe 102. According to this construction, the dispersion of the fine end height of each probe or irregularities on machined suface, even if there is any, are absorbed by the elastic material and a uniform machining area is obtained.
申请公布号 JP2000100370(A) 申请公布日期 2000.04.07
申请号 JP19980272842 申请日期 1998.09.28
申请人 SEIKO EPSON CORP 发明人 ISHIDA MASAYA;IDE TSUGIO;KATSUYAMA TAKANOBU
分类号 H01J37/30;G01N37/00;G01Q60/16;G01Q70/06;G01Q80/00;G11B9/00;G11B9/14;(IPC1-7):H01J37/30;G01N13/12;G01N13/10 主分类号 H01J37/30
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