| 摘要 |
<p>PROBLEM TO BE SOLVED: To easily and properly conduct determination for an upper limit value and a lower limit value of a wave height selected by a wave height analyzer, in a wavelength dispersion type fluorescence X-ray analyzer. SOLUTION: This analyzer is provided at least with a memory means 15 for storing energy of each fluorescent X-ray 7, an escape peak generated probably in a detector 8, the X-ray 7 generated in a spectrograph 6 as data, an operation means 11 for identifying a peak in a differential curve indicating a counting rate with respect to a voltage of a pulse generated in the detector 8 based on the data stored in the memory means 15, and a display means 16 for displaying an identified result of the peak in the differential curve by the operation means 11.</p> |
