发明名称 |
CIRCUIT FOR MONITORING REFERENCE CELL OF FLASH MEMORY |
摘要 |
PURPOSE: A circuit is provided to obtain a precise reference voltage by controlling the reference voltage with a measurement of an electric current of a cell being a reference when reading memory data. CONSTITUTION: A circuit comprises: a threshold voltage control part(10) for programming a threshold voltage(Vt) by supplying a voltage to a drain of a reference cell(REF CELL); a reference voltage generation part(20) for generating a reference voltage by an amount of an electric current when a voltage is applied to the drain of the reference cell(REF CELL); a reference voltage measurement part(30) for measuring if a reference voltage produced from the reference voltage generation part(20); a reference cell(REF CELL) generating a reference voltage for reading data by the threshold voltage; and a cell current measurement part(100) capable of measuring a current flowing in the reference cell during applying a predetermined voltage to the reference cell in which a threshold voltage is programmed.
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申请公布号 |
KR20000019369(A) |
申请公布日期 |
2000.04.06 |
申请号 |
KR19980037419 |
申请日期 |
1998.09.10 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, YUN SAENG |
分类号 |
G11C16/06;(IPC1-7):G11C16/06 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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