发明名称 MANUFACTURING METHOD OF CAPACITOR IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A manufacturing method of a capacitor is provided to prevent a resistance between a storage electrode and a plug from increasing by controlling an oxidation of a barrier layer. CONSTITUTION: A manufacturing method of a capacitor comprises the steps of: forming on a semiconductor substrate of a first conductivity in which a transistor including an impurity region of a second conductivity is formed, an insulation layer having a contact hole exposing the impurity region; sequentially evaporating a contact layer in contact with the plug on the insulation layer, a first barrier layer and a storage electrode, and patterning for exposing the insulation layer so that only a portion corresponding to the plug is remained; forming a second barrier layer on the patterned side walls of the contact layer; and forming a dielectric layer and an upper electrode on the lower electrode and the second barrier layer.
申请公布号 KR20000019285(A) 申请公布日期 2000.04.06
申请号 KR19980037293 申请日期 1998.09.10
申请人 HYUNDAI SEMICONDUCTOR CO., LTD. 发明人 OH, GI YEONG
分类号 H01L27/04;H01L21/02;H01L21/285;H01L27/108;(IPC1-7):H01L27/04 主分类号 H01L27/04
代理机构 代理人
主权项
地址