发明名称 |
MANUFACTURING METHOD OF CAPACITOR IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of a capacitor is provided to prevent a resistance between a storage electrode and a plug from increasing by controlling an oxidation of a barrier layer. CONSTITUTION: A manufacturing method of a capacitor comprises the steps of: forming on a semiconductor substrate of a first conductivity in which a transistor including an impurity region of a second conductivity is formed, an insulation layer having a contact hole exposing the impurity region; sequentially evaporating a contact layer in contact with the plug on the insulation layer, a first barrier layer and a storage electrode, and patterning for exposing the insulation layer so that only a portion corresponding to the plug is remained; forming a second barrier layer on the patterned side walls of the contact layer; and forming a dielectric layer and an upper electrode on the lower electrode and the second barrier layer.
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申请公布号 |
KR20000019285(A) |
申请公布日期 |
2000.04.06 |
申请号 |
KR19980037293 |
申请日期 |
1998.09.10 |
申请人 |
HYUNDAI SEMICONDUCTOR CO., LTD. |
发明人 |
OH, GI YEONG |
分类号 |
H01L27/04;H01L21/02;H01L21/285;H01L27/108;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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