发明名称 METHOD AND APPARATUS FOR CLEANING LOW K DIELECTRIC AND METAL WAFER SURFACES
摘要 <p>Disclosed is a method for cleaning hydrophobic surfaces, such as low K dielectric organic or inorganic surfaces as well as metallization surfaces of a semiconductor wafer. The method includes: (a) applying a surfactant solution to the surface; (b) scrubbing the surface; and (c) spin-rinsing the surface of the substrate using de-ionized water to complete a removal of any contaminants from the surface. If needed, the surfactant solution can be mixed with a chemical enhancer, and the scrubbing can be performed in a brush system. The brush system may be configured to apply DI water using a through the brush (TTB) technique. The surfactant solution can be applied either using a drip technique or using the TTB technique.</p>
申请公布号 WO2000018523(A1) 申请公布日期 2000.04.06
申请号 US1999019634 申请日期 1999.08.26
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