METHOD FOR REMOVING ACCUMULATED SOLDER FROM PROBE CARD PROBING FEATURES

摘要

A method for removing deposits from a probing feature (72) of a probe card (70), the method includes the step of exposing the probing feature of a probe card to a composition (76) that chemically reacts with the deposits on the probing feature to remove the deposits from the probing feature while not substantially effecting the material comprising the probing feature.