发明名称 |
METHOD FOR REPRODUCING SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: A method for reproducing semiconductor wafer is provided to improve a productivity according to a manufacture of a semiconductor device by reproducing a wafer and reusing the wafer. CONSTITUTION: An oxidation film(12) and a titanium film(14) are successively formed on a wafer. The titanium film(14) is removed using an aqueous HF solution which an HF is attenuated to a deionized water about 15 percent to 25 percent degrees. The wafer(10) is a bare wafer on which a pattern is formed or a wafer on which the oxidation film is not formed. A nitration titanium film is removed using a mixed solution which mixes a HNO3 and a CH3COOH to the HF about 3 percent to 7 percent degrees and the wafer is reproduced.
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申请公布号 |
KR20000018623(A) |
申请公布日期 |
2000.04.06 |
申请号 |
KR19980036286 |
申请日期 |
1998.09.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MA, SANG BAE |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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