发明名称 METHOD FOR REPRODUCING SEMICONDUCTOR WAFER
摘要 PURPOSE: A method for reproducing semiconductor wafer is provided to improve a productivity according to a manufacture of a semiconductor device by reproducing a wafer and reusing the wafer. CONSTITUTION: An oxidation film(12) and a titanium film(14) are successively formed on a wafer. The titanium film(14) is removed using an aqueous HF solution which an HF is attenuated to a deionized water about 15 percent to 25 percent degrees. The wafer(10) is a bare wafer on which a pattern is formed or a wafer on which the oxidation film is not formed. A nitration titanium film is removed using a mixed solution which mixes a HNO3 and a CH3COOH to the HF about 3 percent to 7 percent degrees and the wafer is reproduced.
申请公布号 KR20000018623(A) 申请公布日期 2000.04.06
申请号 KR19980036286 申请日期 1998.09.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MA, SANG BAE
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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