SEMICONDUCTOR DEVICE CAPABLE OF CHARACTERISTIC TEST BEFORE PERFORMING REPAIR

摘要

PURPOSE: A semiconductor device capable of a characteristic test before performing a repair is provided, which can perform a characteristic test of a memory chip to residual memory cells except for memory cells failed before performing a repair. CONSTITUTION: A semiconductor device capable of a characteristic test before performing a repair comprises: a data input/output pad (300) for inputting and outputting data; a data input/output buffer (310) for receiving data from the data input/output pad (300) and performing a buffering operation; a sense amplifier (340) for sensing and amplifying data read from a memory cell; a data output buffer (330) for receiving data outputted from the sense amplifier (340) and outputting the received data to the data output buffer (330); and a control unit (320) for responding to a plurality of control signals and controlling the path of data outputted from the data input/output buffer (310) and the path of data outputted through the sense amplifier (340). Thereby, it is possible to decrease the development period of a memory chip.