发明名称 |
Surface grinding method and apparatus for thin plate work |
摘要 |
The present invention provides a surface grinding method and apparatus for achieving a thin plate work such as a semiconductor wafer with high flatness, high accuracy and certainty and the apparatus comprises: a surface grinder in which a grinding wheel support member 3 by which a rotary shaft 5 of a grinding wheel 6 is supported is held by a pivotal shaft portion 4 and a grinding wheel shaft inclination control motor 9 which displaces the grinding wheel support member 3 by activating the pivotal shaft portion 4 is provided; a corrective angle storage device 15 which stores a corrective angle of an inclination angle of a rotary shaft 5 of the grinding wheel 6 to a rotary shaft 13 of a wafer 12; and a shaft inclination control apparatus 14 which sends out a signal to control the grinding wheel shaft inclination control motor 9 while reading a corrective angle of the corrective angle storage device 15, wherein a relative inclination angle of the grinding wheel to the thin plate work, in a more concrete manner an inclination angle of the rotary shaft 5 of the grinding wheel 6, is changed for each of grinding steps of high rate feed, low rate feed and spark-out. <IMAGE> |
申请公布号 |
EP0955126(A3) |
申请公布日期 |
2000.04.05 |
申请号 |
EP19990108711 |
申请日期 |
1999.04.30 |
申请人 |
SHIN-ETSU HANDOTAI CO., LTD. |
发明人 |
OKABE, KEIICHI;OKUNI, SADAYUKI;KATO, TADAHIROI;OSHIMA, HISASHI |
分类号 |
B24B47/20;B24B1/00;B24B7/04;B24B7/22;B24B51/00;H01L21/304 |
主分类号 |
B24B47/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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