| 发明名称 |
Test socket for an IC device |
| 摘要 |
A test socket for an IC device has relatively thin contact interface wall having an array of double-ended pogo pins. The double-ended pogo pins provide resilient spring-loaded contacts for the I/O contacts of an IC device held in the socket as well as for the circuit contacts of a PC board to which the socket is mounted.
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| 申请公布号 |
US6046597(A) |
申请公布日期 |
2000.04.04 |
| 申请号 |
US19950538956 |
申请日期 |
1995.10.04 |
| 申请人 |
OZ TECHNOLOGIES, INC. |
发明人 |
BARABI, NASSER |
| 分类号 |
G01R1/04;G01R31/26;G01R31/28;H01L23/40;H01L23/48;H01R13/24;H01R33/74;H05K7/10;(IPC1-7):G01R1/073 |
主分类号 |
G01R1/04 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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