发明名称 |
FABRICATION METHOD OF FLASH MEMORY CELL |
摘要 |
PURPOSE: A method for manufacturing a flash memory cell is provided to simplify a manufacturing process by patterning simultaneously a floating gate and a select gate. CONSTITUTION: A gate oxide layer(12) and the first polysilicon layer are formed on a silicon substrate(11). A floating gate(13A) and a select gate(13B) are formed by patterning the first polysilicon layer. An insulating layer spacer(16) is formed at both sidewalls of the floating gate(13A) and the select gate(13B). A dielectric layer(14) and the second polysilicon layer are laminated sequentially on an upper portion of the whole structure. A control gate(15A) is formed on the floating gate by patterning the second polysilicon layer. A junction region(19) is formed by implanting dopant ions into the silicon substrate(11).
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申请公布号 |
KR100250753(B1) |
申请公布日期 |
2000.04.01 |
申请号 |
KR19960054381 |
申请日期 |
1996.11.15 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
SONN, KWANG-SHIK |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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