PROCESSING METHOD FOR EDDY CURRENT EXAMINATION DATA

摘要

PROBLEM TO BE SOLVED: To conduct automatic detection for a flaw signal part difficult in detection in conventional eddy current examination because of influences of a noise and an off-set. SOLUTION: The first signal processing is carried out for a data of an eddy current examination result to intensify a flaw signal part, the second signal processing for intensifying the flaw signal part different from the first signal processing, and a product of results provided by the two signal processings is calculated to prepare a data intensifying further more the flaw part signal.