发明名称 |
MANUFACTURE OF GALLIUM NITRIDE COMPOUND SEMICONDUCTOR LIGHT EMITTING ELEMENT |
摘要 |
<p>PROBLEM TO BE SOLVED: To obtain a light emitting element using a gallium nitride compound semiconductor having controlled conductivity and electron density. SOLUTION: An AlN buffer layer 2 having a film thickness of 500Å, a higher carrier-density N+-type silicon-doped GaN layer 3 having a film thickness of bout 2.2μm and an electron density of 1.5×1018/cm3, a lower carrier-density N-type GaN layer 4 having a film thickness of about 1.5μm and an electron density of <=1×1015/cm3, and an I-type GaN layer 5 having a film thickness of about 0.2μm are successively formed on a sapphire substrate 1. In addition, aluminum electrodes 7 and 8 are respectively formed on the I-type layer 5 and N+-type layer 3 and connected to the layers 5 and 3.</p> |
申请公布号 |
JP2000091640(A) |
申请公布日期 |
2000.03.31 |
申请号 |
JP19990284752 |
申请日期 |
1999.10.05 |
申请人 |
TOYODA GOSEI CO LTD;TOYOTA CENTRAL RES & DEV LAB INC;UNIV NAGOYA;JAPAN SCIENCE & TECHNOLOGY CORP |
发明人 |
SASA MICHINARI;MANABE KATSUHIDE;MABUCHI AKIRA;KATO HISAYOSHI;HASHIMOTO MASAFUMI;AKASAKI ISAMU |
分类号 |
H01L21/205;H01L33/12;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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