发明名称 INSPECTION APPARATUS FOR HEAT-SEALED PACKAGE
摘要 PROBLEM TO BE SOLVED: To obtain an inspection apparatus by which the abnormal part such as the seal defect, the pinhole or the like of a package bag can be judged without discrimination by a method wherein difference image data between measured thermal image data which is imaged by an infrared imaging device and fundamental thermal image data is compared with a prescribed threshold value and the abnormal part is judged. SOLUTION: Thermal image data which is obtained by imaging a completely heat- sealed plastic package bag by using an infrared imaging device 2 is stored in a fundamental thermal-image storage means 4 as fundamental thermal-image data. Then, measured thermal image data which is imaged by the infrared imaging device 2 and which is stored once in a measured thermal-image storage means 3 and the fundamental thermal-image data are outputted to a subtraction processing means 5 so as to perform a subtraction processing operation, and difference image data is outputted to an abnormality judgment means 6. In the abnormality judgment means 6, the difference image data is compared with a prescribed threshold value. When the difference image data is larger than the threshold value, it is judged that the heat-sealed part of the package bag is defective, an abnormality signal is outputted to a warning means 8, and the difference image data is outputted to a VTR 7.
申请公布号 JP2000088781(A) 申请公布日期 2000.03.31
申请号 JP19980257259 申请日期 1998.09.10
申请人 NIKKISO CO LTD 发明人 OKADA MUTSUO
分类号 B65B57/02;G01M3/02;G01N25/72;(IPC1-7):G01N25/72 主分类号 B65B57/02
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