发明名称 |
METHOD AND EQUIPMENT FOR MEASURING PLANE SHAPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an equipment for measuring the shape of a plane having area larger than that of a measuring aperture while splitting by scanning the aperture in which the error is not increased at a joint even if the number of synthesizing times is increased. SOLUTION: An interferometer 10 having a measuring aperture opening to the side of a plane 11a to be measured is fixed movably to a direct driven stage 12 and scanning is performed by driving the direct driven stage 12 in the X direction. An angle reference mirror 13 for measuring the rotation of the interferometer 10 about the Y axis is applied to the side face of the interferometer 10 in the X direction. Furthermore, an autocollimator 14 for measuring the rotational angle of the interferometer 10 about the Y axis is arranged at a position where the autocollimator 14 faces the angle reference mirror 13 from the X direction. The interferometer 10, the direct driven stage 12 and the autocollimator 14 are connected with a calculation control section 15. |
申请公布号 |
JP2000088551(A) |
申请公布日期 |
2000.03.31 |
申请号 |
JP19980256203 |
申请日期 |
1998.09.10 |
申请人 |
FUJI XEROX CO LTD |
发明人 |
SHIMIZU TAKASHI;YAMADA HIDENORI |
分类号 |
G01B11/24;G01B11/245;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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