发明名称 HEATING DEVICE FOR REACTOR
摘要 PROBLEM TO BE SOLVED: To reduce the size of a heating facility and, in addition, the expenses incurred in connection with the heating facility and gas supply, by providing a gas supply means which is provided to at least the wall of a reactor and has a plurality of passages provided in the body of the reactor, and heating the passages by means of a heating means also provided in the body of the reactor. SOLUTION: A reactor for treating a wafer at a high temperature is provided with a heating device which heats wafers, and a gas supply means which supplies a process gas for the wafers. The gas supply means is provided to at least the wall of a reactor and has a plurality of passages 8 and 9 provided in the body of the reactor. In addition, the passages are heated by means of a heating means 16 provided in the body of the reactor. The heating device is provided with the heating means 16. Such a floating wafer reactor is provided that a treating division is limited between the two facing walls of the reactor and each wall has gas discharging openings 6.
申请公布号 JP2000091249(A) 申请公布日期 2000.03.31
申请号 JP19990248613 申请日期 1999.09.02
申请人 ASM INTERNATL NV 发明人 VLADIMIR IVANOVICH KUZNETSOV
分类号 H01L21/22;C23C16/455;C30B25/10;C30B25/14;C30B31/12;C30B31/16;F27D11/02;H01L21/00;H01L21/205;H01L21/324;(IPC1-7):H01L21/205 主分类号 H01L21/22
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