| 摘要 |
PROBLEM TO BE SOLVED: To detect and diagnose a defect of a structural member applied with a load using a semiconductor magnetic sensor without impressing a magnetic field or the like. SOLUTION: A magnetic sensor 10 for detecting a magnetic field utilizing a galvano magnetic electric field effect or a magnetic induction action is moved contactlessly along a surface of a structural member 20 applied with a load comprising a magnetic material or a material put on with magnetism by working, which is coated with a coating film in some cases, a magnetic flux density of a work is detected without magnetizing it by a coil or the like, and a provided detected signal therein is image-analyzed, so as to provide a method for providing an isomagnetic line diagram, a method for diagnosing a defect of the structural member 20 based on the diagram, a device for providing the diagram by image-analyzing the magnetic flux density of the member 20, and a device for diagnosing the defect of the member 20 by determination-comparing the diagram with a reference isomagnetic line diagram preliminarily stored.
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