A METHOD AND ARRANGEMENT FOR MEASURING TEMPERATURE IN AN INTERMITTENTLY OPERATING SEMICONDUCTOR

摘要

The present invention relates to a method and to arrangements for measuring temperature in an intermittently operating semiconductor. The method comprises the following steps: establishing that the semiconductor is in an inactive period; connecting a measuring circuit to the semiconductor; measuring a temperature-dependent electric quantity of the semiconductor component; converting the measured quantity to a temperature value that corresponds to the temperature of the semiconductor component.