发明名称 METAL-CONTACT INDUCED CRYSTALLIZATION IN SEMICONDUCTOR DEVICES
摘要 <p>The method of the invention induces crystallization in an amorphous semiconductor layer (16), and includes the steps of: a) producing a patterned metal layer (18) on a first substrate (17), the metal layer (18) exhibiting a weak level of adherence to the first substrate; b) pressing the metal layer (18) into physical contact with the amorphous semiconductor layer (16); c) applying heat, light or both to the metal layer (18) and amorphous semiconductor layer (16) to cause a reaction therebetween and a crystallization of the amorphous semiconductor that is juxtaposed to the metal.</p>
申请公布号 WO2000017918(A1) 申请公布日期 2000.03.30
申请号 US1999021649 申请日期 1999.09.21
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