发明名称 |
Electrical insulation testing of thin base material, for multilayer printed circuit board, applies voltage avoiding breakdown, then breakdown current measurement |
摘要 |
Edges of the copper layers (1, 2) are made smooth and uniform. Testing establishes adequate electrical resistance between layers, using a test voltage lower than the insulating layer breakdown voltage. Preferred Features: A subsequent test establishes the current flow resulting from breakdown of the insulating layer (3). Smooth edges are first produced by a milling or sawing process. Testing employs DC voltages. For the insulating base and intermediate layers (4/5, 5/6) of the multilayer circuit board (M), identical material of the same thickness is used.
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申请公布号 |
DE19840167(A1) |
申请公布日期 |
2000.03.30 |
申请号 |
DE19981040167 |
申请日期 |
1998.09.03 |
申请人 |
HEWLETT-PACKARD CO., PALO ALTO |
发明人 |
BARTH, HERMANN |
分类号 |
G01R31/28;H05K1/02;H05K3/00;(IPC1-7):G01R27/02;H05B3/46;G01R31/12 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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