发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE OF THE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having resistance elements with stable resistance values, a semiconductor storage and a manufacturing method of the semiconductor device. SOLUTION: On a semiconductor substrate 1, this semiconductor device has a resistance portion 13, made of polysilicon where impurities are diffused, a first insulating film (SIN film) 14 formed on the resistance portion 13, a second insulating film (SIN film) 15 formed on the first insulating film 14 and an impurity-containing layer (BPSG film) 16 formed on the second insulating film 15.
申请公布号 JP2000091447(A) 申请公布日期 2000.03.31
申请号 JP19980256784 申请日期 1998.09.10
申请人 SONY CORP 发明人 KOGA HIROYOSHI
分类号 H01L21/265;H01L21/8244;H01L27/11 主分类号 H01L21/265
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