Integrated circuit contact point leakage current test method

摘要

Leakage current test method involves receiving at the point of contact (1) of an integrated circuit (IC) receives a test voltage at a given potential (T) via an output of a test voltage applicator (3,6), the output (6) being high-resistance in circuit or isolated form the point of contact (1). The potential (P) of the point of contact (1) is determined as a measure of the occurring leakage current. More specifically, the potential (P) is ascertained after a given length of time (t1), and it is verified whether the ascertained potential exceeds or fails to attain a threshold value.