发明名称 Method of fabricating contact plug
摘要 A method of fabricating a metal plug. On a semiconductor substrate comprising a MOS device, a dielectric layer, and a via hole penetrating though the dielectric layer, a conformal titanium layer is formed on the dielectric layer and the via hole. A low temperature annealing is formed in a nitrogen environment, so that a surface of the titanium layer is transformed into a first thin titanium nitride layer. A conformal second titanium nitride layer is formed on the first thin titanium nitride layer by using collimator sputtering. A metal layer is formed and etched back on the second titanium nitride layer to form a metal plug.
申请公布号 US6043148(A) 申请公布日期 2000.03.28
申请号 US19980061613 申请日期 1998.04.16
申请人 UNITED MICROELECTRONICS CORP. 发明人 PENG, YUAN-CHING;CHEN, LIH-JUANN;YANG, YU-RU;HSIEH, WIN-YI;HSIEH, YONG-FEN
分类号 H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/768
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