发明名称 FERMI THRESHOLD FIELD EFFECT TRANSISTOR WITH REDUCED GATE AND DIFFUSION CAPACITANCE
摘要 An improved Fermi FET structure with low gate and diffusion capacity allows cond uction carriers to flow within the channel at a predetermined depth in the substrate below the gate, without requiring an i nversion layer to be created at the surface of the semiconductor. The low capacity Fermi FET is preferably implemented using a Fermi Tub having a predetermined depth, and with a conductivity type opposite the substrate conductivity type and the same c onductivity type as the drain and source diffusions.
申请公布号 CA2117426(C) 申请公布日期 2000.03.28
申请号 CA19932117426 申请日期 1993.01.28
申请人 发明人 VINAL, ALBERT W.
分类号 H01L21/265;H01L29/10;H01L29/78;(IPC1-7):H01L29/772;H01L27/088;H01L29/788 主分类号 H01L21/265
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