| 摘要 |
Apparatus (10) is used to obtain information relating to the shape of particles in a sample (12). The sample is illuminated with polarized radiation from a source (14). Scattered radiation (16) leaves the sample (12) and is measured (at 18) by sensors (18a, 18b) which measure intensity at different polarization states. Measurements from the sensors (16a, 16b) are provided to a control arrangement (20), which may be in the form of a computer, which combines data to produce a data value for the corresponding scattering angle. The set of data so produced is characteristic of the particle shape. |
