发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: A semiconductor device fabricating method is provided to form a diameter of a resist hole pattern or a division width of a resist line pattern finely. CONSTITUTION: The semiconductor device fabricating method comprises the steps of: forming a hole pattern or a division pattern of a first resist (2) which is capable of supplying an acid on a semiconductor substrate (1); forming a bridging film (an organic frame) (7) at a side wall of the pattern of the first resist to reduce the hole diameter of the resist pattern or the division width of the resist pattern; reducing the division width by use of a thermal reflow phenomenon of the bridging film (7); and etching the semiconductor substrate (1) by use of the resist pattern as a mask.
申请公布号 KR20000016843(A) 申请公布日期 2000.03.25
申请号 KR19990011629 申请日期 1999.04.02
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 SGINO KANJI;ISHIBASHI TAKEO;SOYATAKA YUKI
分类号 H01L21/302;G03F7/00;G03F7/40;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/311 主分类号 H01L21/302
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