发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A semiconductor device fabricating method is provided to form a diameter of a resist hole pattern or a division width of a resist line pattern finely. CONSTITUTION: The semiconductor device fabricating method comprises the steps of: forming a hole pattern or a division pattern of a first resist (2) which is capable of supplying an acid on a semiconductor substrate (1); forming a bridging film (an organic frame) (7) at a side wall of the pattern of the first resist to reduce the hole diameter of the resist pattern or the division width of the resist pattern; reducing the division width by use of a thermal reflow phenomenon of the bridging film (7); and etching the semiconductor substrate (1) by use of the resist pattern as a mask. |
申请公布号 |
KR20000016843(A) |
申请公布日期 |
2000.03.25 |
申请号 |
KR19990011629 |
申请日期 |
1999.04.02 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION |
发明人 |
SGINO KANJI;ISHIBASHI TAKEO;SOYATAKA YUKI |
分类号 |
H01L21/302;G03F7/00;G03F7/40;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/311 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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