发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A semiconductor memory device is provided, which CONSTITUTION: The semiconductor memory device comprises: two P channel transistors (QP1, QP2) and two N channel transistors (QN1, QN2). The P channel transistor (QP1) to be connected between a sub word selecting line (RA) and the P channel transistor (QP2), which a gate is connected to a main word line (MWL'). The P channel transistor (QP2) to be connected between the P channel transistor (QP1) and a sub wordline (SWL), which a gate is connected to the ground. The N channel transistor (QN1) to be connected between the sub wordline (SWL) and a sub voltage (Vnb), which a gate is connected to a sub wordline selecting line (RAB). The N channel transistor (QN2) to be connected between the sub wordline (SWL) and the sub voltage (Vnb), which a gate is connected to a main wordline (MWL). Thereby, it is possible to maintain a low maximum voltage and decrease the current consumption.
申请公布号 KR20000017274(A) 申请公布日期 2000.03.25
申请号 KR19990033071 申请日期 1999.08.12
申请人 NEC CORPORATION 发明人 OSSKI DESSYA
分类号 G11C17/18;G11C8/08;G11C8/10;G11C8/14;G11C11/406;G11C11/407;G11C16/06;(IPC1-7):G11C11/406 主分类号 G11C17/18
代理机构 代理人
主权项
地址