发明名称 WAFER TRANSFER APPARATUS
摘要 PURPOSE: A wafer transfer apparatus is provided to conduct an exact die bonding at a die boding process by determining a position of a wafer to a reference position adjusting a position of a division line into a rotation direction and into a length and breadth direction. CONSTITUTION: The wafer transfer apparatus comprises a location determining unit (400), a transfer tape mounting unit (600) and a protection tape flaking unit (800). The location determining unit (400) positions a protection tape-attached wafer to a position determining table, and adjusts a position of the wafer into a rotation direction and into a length and breadth direction to determine the position of the wafer to a reference position. The transfer tape mounting unit (600) positions the wafer thus determined to a transfer tape mounting table, and attaches a transfer tape to a ring frame and a wafer surface at the same time so as to be unified with the ring frame. The protection tape flaking unit (800) positions the wafer thus unified to a protection tape flaking table, attaches one end of a flaking tape to one end of the protection tape of a wafer surface side, and flakes the protection tape from the wafer surface by drawing the flaking tape.
申请公布号 KR20000017308(A) 申请公布日期 2000.03.25
申请号 KR19990033526 申请日期 1999.08.14
申请人 LINTEC CORPORATION;KABUSHIKI KAISHA TOSHIBA 发明人 CHUJIMATO MASAKI;KOBAYASHI GENJI;NUMATA HIDEO;TOKUBUCHI GEISKE
分类号 B65G49/07;H01L21/00;H01L21/301;H01L21/50;H01L21/52;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 B65G49/07
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