| 摘要 |
PURPOSE: An integrated circuit(IC) testing device is provided to have a semiconductor IC testing device for testing a semiconductor integrated circuit, which is a mixer of a logic part and a memory part in a chip, appropriately, and a controlling method of the semiconductor IC testing device for prescribing order of the semiconductor IC testing device. CONSTITUTION: The IC testing device institutes IC sockets (SK1¯SK8) and a converting circuit(21) between the channels of the IC socket and the IC testing device. These sockets have the same numbers with memory parts, which are capable of testing simultaneously and decided by required channel numbers for testing the memory parts of a testing IC and channel numbers of the IC testing device to the IC testing device(10), which has predetermined channel numbers(CH1¯CH512) to supply a driving signal to the testing IC.
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