发明名称 INSPECTING MACHINE FOR LIQUID CRYSTAL IMAGE DISPLAY DEVICE AND PRODUCTION OF LIQUID CRYSTAL IMAGE DISPLAY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To detect display defects of a liquid crystal panel due to organic contamination in a short time which can not conventionally detected unless ageing by energizing for a long time is carried out, and to easily find and control organic contamination in an early stage by providing a heating means to blow hot air at a predetermined temperature to a liquid crystal image display device and carrying out image inspection in a high temperature operation state. SOLUTION: A liquid crystal panel 1 is inspected while a glass plate 46 heated by a heating device 45 such as a hot plate is in contact with the upper or lower face of the liquid crystal panel 1. The heating temperature depends on the degree of organic contamination, but preferable result is obtained at 60 to 80 deg.C. The contact time is at least 10 sec or longer, and if it is less than 10 sec, the temperature of the liquid crystal panel can not be stabilized. The inspection method to bring the heated glass substrate 46 into contact with the liquid crystal panel 1 enables accurate inspection because uniformity of heating is easily obtained, however, the method has a drawback of rather complicated mechanism. As for an easy heating method, for example, hot air 48 may be blown to the liquid crystal panel 1 by a dryer 47 or the like.</p>
申请公布号 JP2000081599(A) 申请公布日期 2000.03.21
申请号 JP19990272782 申请日期 1999.09.27
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KAWASAKI KIYOHIRO
分类号 G02F1/13;G02F1/1337;G02F1/136;G02F1/1365;G02F1/1368;(IPC1-7):G02F1/13 主分类号 G02F1/13
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