| 摘要 |
<p>PROBLEM TO BE SOLVED: To correct distance characteristics by correcting a projection profile or correcting the fluctuations of light detection quantity due to the distance change of matter to be detected by the aperture or optical element arranged in the light path, wherein regular reflected light is incident on a photodetector in a reflection type photoelectric sensor detecting glossiness or the like by utilizing regular reflected light. SOLUTION: The beam profile of reflected light at the position of a photodetector 5 is set so as to have an increase tendency in one direction on a projection side, or an aperture or an optical element 3 is provided in a light path. Thus, the fluctuations of light detection quantity due to the distance change of matter to be detected can be corrected. By this constitution, the distance characteristics only of regular reflected light can be corrected without considering the effect of diffusing reflected light.</p> |
