发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which is manufactured by a manufacturing method and its manufacturing apparatus for an improved semiconductor device. SOLUTION: A lower-layer interconnection 12 is formed inside a recessed part which is formed on a first insulating film 11 formed on a semiconductor substrate. At least one layer of a thin film is formed on at least one layer of a conductive layer which is formed on the semiconductor substrate, in such a way that the lower-layer interconnection 12 is covered. The thin film is patterned so as to form a hard mask. While the hard mask is used as an etching mask, the conductive layer is etched. A conductive pillar-shaped structure 14 whose surface is covered with the hard mask is formed on the lower-layer interconnection 12. A second insulating film is formed on the semiconductor substrate in such a way that the pillar-shaped structure 14 is buried. A wiring groove in which at least the hard mask is exposed is formed. The hard mask is removed. A conductor is then buried in the wiring groove. An upper-layer interconnection is formed on the wiring groove. |
申请公布号 |
JP2000082739(A) |
申请公布日期 |
2000.03.21 |
申请号 |
JP19990074043 |
申请日期 |
1999.03.18 |
申请人 |
TOSHIBA CORP |
发明人 |
AZUMA KAZUYUKI;MATSUNAGA NORIAKI;KAJITA AKIHIRO;MATSUDA TETSURO;IIJIMA TADASHI;KANEKO HISAFUMI;SHIBATA HIDEKI;NAKAMURA NAOFUMI;EMU BII ANANDO;OKUMURA KATSUYA |
分类号 |
H01L21/3205;H01L21/768;H01L23/522;(IPC1-7):H01L21/768;H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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