发明名称 Multiple image reticle for forming layers
摘要 A multi-image reticle used to form integrated circuitry a two dimensional array of spaced images arranged in a matrix of controllably spaced rows and columns of images on a single reticle. No rotation of the reticle is required to expose various levels of circuitry on a semiconductor wafer. The wafer is held in a stepper device, which controllably positions the wafer under the desired image of the mask for exposure of a resist on the wafer. A movable aperture controls exposure through a selected image or mask pattern on the reticle. By controlling which image is used, and accurately positioning the wafer via the stepper, multiple images are accurately registered, leading to improvement in dimensions of circuitry and other structures formed on the wafer.
申请公布号 US6040892(A) 申请公布日期 2000.03.21
申请号 US19970914417 申请日期 1997.08.19
申请人 MICRON TECHNOLOGY, INC. 发明人 PIERRAT, CHRISTOPHE
分类号 G03F1/08;G03F1/14;G03F7/20;H01L21/027;(IPC1-7):G03B27/42;G03F9/00 主分类号 G03F1/08
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