| 摘要 |
PROBLEM TO BE SOLVED: To precisely detect white flaws due to the pixel defects of a solid-state image pickup element, and to satisfactorily correct the white flaws by a single video camera by setting a gain preliminarily set for detecting defective pixels, gain-adjusting the output signal of a solid-state image pickup element in a shielded state, and detecting the defective pixels from the gain-adjusted signal. SOLUTION: A white flaw correcting circuit 7 continuously closes an iris 2 for preventing any light signal from being made incident to a solid-state image pickup element 4. Also, the gain of an AGC circuit 5 is increased for easily detecting the white flaws. After the iris is closed and the gain is increased, a signal from each pixel of the solid-state image pickup element 4 is read synchronously with the pulse of a synchronizing signal generating circuit 3. An output from the solid-state image pickup element 4 is of a dark current only. Thus, the derection of the white flaws is performed in a state that the iris 2 is closed so that the level comparison of only the dark current can be attained, and the influence of an object can be excluded, and the white flaws can be precisely detected.
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