发明名称 INSPECTING METHOD AND APPARATUS FOR TRANSPARENT SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To permit inspecting of finished condition in convex working quickly and as total inspection. SOLUTION: Light from a monochromatic light source 26 is applied to a crystal blank 1 subjected to a convex working once polarized by a polarizer 21 and the light polarized at a specified angle to the polarization thereof is let to pass by an analyzer 22 out of the light passing through the crystal blank 1 so that a phase difference is made visible corresponding to the difference of the thickness of the crystal blank 1 by causing a polarization-oriented interference. Then, photographing is performed. A ring-like interference fringe appears on an image of the blank surface of the crystal blank 1 taken to allow discrimination of the finished condition in working. An image processor 14 further performs a processing to intensify the contrast of the interference fringe by binary coding. The resulting binary coding data undergoes a statistical processing to be conducive to the standardization of the convex working evaluation and a GO/NO GO inspection.
申请公布号 JP2000081312(A) 申请公布日期 2000.03.21
申请号 JP19980352676 申请日期 1998.12.11
申请人 NIPPON MAKUSHISU:KK 发明人 KOBAYASHI SATORU
分类号 G01B11/06;G01N21/21;G01N21/41;G01N21/88;G01N21/958;(IPC1-7):G01B11/06 主分类号 G01B11/06
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