发明名称 SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To prevent current flow between an electrode end on an insulation film and a conductive layer having potential difference such as EQR (Equipotential Ring) and the like with regard to semiconductor elements such as a high withstand-voltage diode and the like. SOLUTION: A P-type diffusion region 3 is formed in an N-type substrate 2 connected to a cathode electrode 1, and the first conductive layer 5 connected to an anode electrode 4 is formed on the P-type diffusion region 3. The first conductive layer 5 and the second conductive layer 7 to be an insulated EQR are formed through a surface insulation film 6. The convexly formed upper edge section 5b of an outer circumference side end 5a of the first conductive layer 5 and the convexly formed upper edge section 7b of an inner circumference side end 7a of the second conductive layer 7 enable prevention of current flow between the first conductive layer 5 and the second conductive layer 7 in relaxing electric field concentration.
申请公布号 JP2000082825(A) 申请公布日期 2000.03.21
申请号 JP19980252319 申请日期 1998.09.07
申请人 MIYAZAKI OKI ELECTRIC CO LTD;OKI ELECTRIC IND CO LTD 发明人 FURUTA KENICHI
分类号 H01L29/73;H01L21/331;H01L29/06;H01L29/78;H01L29/861;(IPC1-7):H01L29/861 主分类号 H01L29/73
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