发明名称 ELECTROSTATIC BREAKDOWN TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To easily conduct an electrostatic breakdown test even if terminals or the like are not similar in shape as a printed board for expanding PC functions, an IC card, a game IC cassette, and the like are mixed. SOLUTION: This electrostatic breakdown test device has a main body device 3 having both a dc power source V generating a predetermined dc voltage and having its negative electrode connected to ground and a resistance R1 connected to the positive electrode of the dc power source V. The test device has a pencil type probe unit 2 having a metallic probe 1 for charging and discharging electricity by making contact with the terminal of a wiring board 4, a first switch means (SW1) connected between the metallic probe 1 and the resistance R1, a second switch means (SW2) connected between the metallic probe 1 and the ground, a control means 2a for switching a connection between the first switch means (SW1) and the second switch means (SW2), and a switch means (button switch BSW1) controlling the drive of the control means 2a. The test device has a cable 3a for connecting the main body device 3 to the probe unit 2.
申请公布号 JP2000081468(A) 申请公布日期 2000.03.21
申请号 JP19980252516 申请日期 1998.09.07
申请人 NEC CORP 发明人 YAMASHITA YUMIKO;SUZUKI KOICHI
分类号 G01R29/24;G01R31/00;G01R31/30;(IPC1-7):G01R31/30 主分类号 G01R29/24
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