| 摘要 |
An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, and further includes a receiver having a coil with a coil axis oriented substantially perpendicular to the driver coil effective coil axis, the receiver having a length, and a width, the length being the dimension in the direction parallel to the scanning path, and the width having a dimension magnitude substantially greater than that of the length. A method for inspecting an object uses such an eddy current probe. An eddy current probe for use in inspecting an object, includes a driver having a coil with an effective coil axis, the driver having a length and a width, the length being the dimension in a direction substantially parallel to a scanning path, and further includes a receiver having a coil with a coil axis oriented substantially perpendicular to the driver coil effective coil axis, where the magnitude of a distance between the receiver and at least one of the edges is less than 0.125 times the width of the driver. A method for inspecting an object uses such an eddy current probe.
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