发明名称 Probe unit and inspection head
摘要 A probe unit comprises a support member having an edge extending in a first direction parallel to the surface of a plate-like test substance; and a plurality of needle-like probes disposed on the edge and extended in a third direction intersecting the first direction and a second direction perpendicular to the surface of the test substance. The plurality of probes are divided into at least a first group and a second group arranged at intervals in the second direction.
申请公布号 US6040704(A) 申请公布日期 2000.03.21
申请号 US19970858019 申请日期 1997.05.16
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 KONDO, MOTOYASU;SAKUMA, FUKUYO;URAKAWA, YOUICHI;YOKOYAMA, YOSHIHITO;HINAI, MASATOSHI
分类号 G01R31/26;G01R1/073;G01R31/28;H01L21/66;(IPC1-7):G01R31/02;G01R1/06 主分类号 G01R31/26
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