发明名称 Method for reclaiming wafer substrate
摘要 <p>A method for reclaiming a wafer substrate material having a metallic film and an dielectric film includes a step for removing the entire metallic film and a part of the dielectric film with a chemical etching agent so as not to substantially dissolve the wafer substrate material itself, a step for removing the residual dielectric layer and the degenerated zone beneath the surface of the substrate by chemical-mechanical polishing, and a step for polishing at least one surface of the substrate.</p>
申请公布号 EP0986097(A2) 申请公布日期 2000.03.15
申请号 EP19990306853 申请日期 1999.08.27
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO;KOBE PRECISION INC. 发明人 HARA, YOSHIHIRO;SUZUKI, TETSUO;TAKADA, SATORU;INOUE, HIDETOSHI
分类号 H01L21/30;H01L21/304;H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/30
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