发明名称 |
APPARATUS FOR CHEMICAL MECHANICAL POLISHING |
摘要 |
PURPOSE: A CMP(chemical mechanical polishing) apparatus is provided to achieve a uniform profile of a polishing pad by using a sectored-shaped end-effector. CONSTITUTION: The apparatus comprises a polishing pad for polishing a wafer and an end-effector (100) having a sectored structure for conditioning the polishing pad. The bottom face of the end-effector, that is the contact part between the polishing pad and the end-effector (100) has comb patterns. The sectored shaped end effector (100) further comprises a plurality of holes (102) for spraying a water and a bar (104) for controlling the profile of the pads.
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申请公布号 |
KR20000014555(A) |
申请公布日期 |
2000.03.15 |
申请号 |
KR19980034039 |
申请日期 |
1998.08.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JU, JUN-YONG |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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