发明名称 APPARATUS FOR CHEMICAL MECHANICAL POLISHING
摘要 PURPOSE: A CMP(chemical mechanical polishing) apparatus is provided to achieve a uniform profile of a polishing pad by using a sectored-shaped end-effector. CONSTITUTION: The apparatus comprises a polishing pad for polishing a wafer and an end-effector (100) having a sectored structure for conditioning the polishing pad. The bottom face of the end-effector, that is the contact part between the polishing pad and the end-effector (100) has comb patterns. The sectored shaped end effector (100) further comprises a plurality of holes (102) for spraying a water and a bar (104) for controlling the profile of the pads.
申请公布号 KR20000014555(A) 申请公布日期 2000.03.15
申请号 KR19980034039 申请日期 1998.08.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JU, JUN-YONG
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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