Method and apparatus for analyzing samples using x-ray spectroscopy
摘要
The method involves using light points to mark the measuring point on a sample using a flexible carrier (4), on which at least one detector is fitted. One light point is projected onto the measuring point using a light conductor inside the carrier. Another light point is projected onto the measuring point through a collimator (2) with the excitation source (1) of the spectrometer. An Independent claim is included for a mobile device for implementing the method.
申请公布号
EP0985926(A2)
申请公布日期
2000.03.15
申请号
EP19990250320
申请日期
1999.09.10
申请人
IFG INSTITUT FUER GERAETEBAU GMBH
发明人
LANGHOFF, NORBERT, PROF. DR.;SCHMALZ, JUERGEN, DIPL.-ING.