发明名称 Method and apparatus for analyzing samples using x-ray spectroscopy
摘要 The method involves using light points to mark the measuring point on a sample using a flexible carrier (4), on which at least one detector is fitted. One light point is projected onto the measuring point using a light conductor inside the carrier. Another light point is projected onto the measuring point through a collimator (2) with the excitation source (1) of the spectrometer. An Independent claim is included for a mobile device for implementing the method.
申请公布号 EP0985926(A2) 申请公布日期 2000.03.15
申请号 EP19990250320 申请日期 1999.09.10
申请人 IFG INSTITUT FUER GERAETEBAU GMBH 发明人 LANGHOFF, NORBERT, PROF. DR.;SCHMALZ, JUERGEN, DIPL.-ING.
分类号 G01N23/207;G01N23/223 主分类号 G01N23/207
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