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发明名称
APPARATUS FOR DETECTING WAFER INSERTION STATUS
摘要
申请公布号
KR200164997(Y1)
申请公布日期
2000.03.15
申请号
KR19990000577U
申请日期
1999.01.19
申请人
SAMSUNG ELECTRONICS CO, LTD.
发明人
BAE, KYOUNG-JEONG;SONN, KWON
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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