| 摘要 |
Quick detection of CMOS integrated circuit troubles with a simple system is realized. A tester repeatedly applies a test pattern to a CMOS integrated circuit under test, and a power supply unit supplies current through a current detection unit to the CMOS integrated circuit. The current detection unit outputs a detection signal, which is coupled through an amplifier to a power spectrum analyzing unit to derive its power spectrum. When the CMOS integrated circuit has a trouble, a quiescent supply current which is set apart from the transistor switching current is caused in specific sub-patterns in the test pattern for every (NT+T0) seconds. A checking unit detects the power of the detection signal in the neighborhood of 1/(NT+T0) [Hz] and thus checks for a quiescent current, i.e., checks for a trouble in the CMOS integrated circuit under test. |
