| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC test device that can test an IC with multiple pins at a low cost. SOLUTION: The general-purpose IC test device is provided with a disconnecting means 112 disconnecting between a controller and a test bus, an original clock stopping means 115, and a bus connecting means 113. A test bus for a plurality of IC test devices is commonly connected by the bus connecting means 113. The test bus commonly connected is connected to a controller of the IC test device and other controllers are disconnected. All of a timing generator, a pattern generator, a logic comparator, a defectiveness analysis memory, and a voltage generator of all IC test devices are controlled by the controller connected, and then the IC with multiple pins can be tested.
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